• Products

    We are the original pioneers of microscopy. From phase contrast to confocal, and from electrons to helium ions, Carl Zeiss has been providing microscopy solutions for more than 160 years. Visit us at booth #13 at the Microscopy Conference (MC) 2013 and discover excellence in imaging and analysis with high performance electron and optical microscopy.

    NEW PRODUCTS RELEASING AT MC

    CrossBeam 540

    Beyond Helium: Taking Nanofabrication to the Next Step

    Discover the world’s first multi-ion beam instrument making an evolutionary leap in nanoscale research by combining helium, neon, and gallium beams and offering the highest resolution in imaging and nanofabrication. Learn more at our booth or at one of the daily HIM workshops in exchange room #1 from 2:00pm - 3:00pm.

    MORE NEW PRODUCTS AT MC

    Come to the ZEISS booth for European demonstrations of the new Lightsheet Z.1.

    Light Sheet Fluorescence Microscope

    The unique Multiview Light Sheet Fluorescence Microscope allows you to record the development of large, living samples and gently image them to deliver exceptionally high information content. Learn more about Lighsheet Z.1 by attending our lecture on  Monday at 16:00pm - 16:30pm in the meeting room H9 or our poster presentation on Tuesday at 4:00pm - 6:00pm. 

    Request a demonstration on the booth.

    Further PRODUCTS AT MC

    Field Emission Scanning Electron Microscope

    Enter the marvelous world of MERLIN FE-SEM. Learn more about the unlimited application capabilities by individual system configuration and lots of recent improvements. Attend our lecture on Tuesday at 1:15pm - 2:00pm.

    Request a demonstration on the booth.

    Atomic Force Microscopy (AFM)

    The AFM Option for Carl Zeiss MERLIN series turns your ZEISS FE-SEM into a worldwide unique, fully integrated SEM/AFM hybrid system.
    This option makes it possible to use the flexibility of a high performance desktop AFM system inside a high end Carl Zeiss FE-SEM. The AFM extends the SEM with an atomically resolved 3rd dimension and enables experiments that have never been possible to do before. Attend our lecture on

    Request a demonstration on the booth.

    Atlas-Solution

    ATLAS combines a 16 bit scan generator and dual super-sampling signal acquisition hardware with image processing and control software for your ZEISS electron microscope.
    Request a demonstration on the booth.

  • Lectures
    Day Specific Carl Zeiss Lectures
    Monday -
    Thursday

    Exchange Room No1
    HIM Workshop 2:00pm - 3:00pm

    LightSheetLecture 3:30pm - 4:30pm
    Please register at the reception desk!

    From 1:15pm - 2:00pm on Monday to Thursday on the exhibition floor, learn more about the exciting technologies from Carl Zeiss. Registration is not required but spaces are limited so your earliest arrival is advised.

    Day Title of Presentation More
    Monday
    September 17th
    Workshop 1: Chris Power
    The Evolution of Optical Sectioning Microscopy - Choosing the correct method for your application
    Details
    Product
      Workshop 2: Stefan Meyer
    Novel TEM EDS Detector for High Solid Angle Detection
    Details
    Product
      Workshop 3: Katja Tsyrulin
    AURIGA Laser: Efficient and precise sample preparation by combination of pulsed laser ablation and FIB milling
    Details
    Product
    Tuesday
    September 18th
    Workshop 1: Sylvia-Gabriele Münter
    Tracking Down Molecular Structures
    ELYRA - discover the world of super-resolution
    Details
    Product
      Workshop 2: Fang Zhou
    Introduction of Merlin FE-SEM series
    Details
    Product
      Workshop 3: Ben Ewins
    Optical Sectioning without Lasers
    A kinder environment for your live cells
    Details
    Product
    Wednesday
    September 19th
    Workshop 1: Stephen Smith
    Improved Methods for Conjugate Immunofluorescence and Electron
    Microscopic Array Tomography
    Details
    Product
      Workshop 2: Benjamin Tordoff
    Introducing SIGMA HD: Fast, multiple channel, EDS mapping combined with simultaneous in-lens SE and multimode STEM detection all in one FE-SEM
    Details
    Product
      Workshop 3: Alexandra Elli
    Bridging the Gap between Structure and Biological Function - Correlative microscopy in bioscience with “Shuttle & Find”
    Details
    Product
    Thursday
    September 20th
    Workshop 1: Chris Power
    Getting more with less Light - LSM 780 - Spectral GaAsP Array Detector - Improved Sensitivity for Fluorescence Detection
    Details
    Product
      Workshop 2: Mohan Ananth
    Nanofabrication at the sub 10 nm length scale using helium ions
    Details
    Product
      Workshop 3: Paul Wetton
    A Step Change in Modern Microscopy - Axio Zoom.V16 a modern tool for life and physical sciences
    Details
    Product
  • Registration

    On this page you can register for a product demo on the booth.

    Select the requested product your preferred date. Before sending your registration, please complete the requested information at the bottom of the page.