Technical cleanliness plays an important role, especially in areas where components are manufactured, such as electrical engineering or the automotive industry. If contamination occurs at particle-sensitive points, this can quickly lead to functional impairments or even malfunctions. If the residual dirt in a system is so low that no damage occurs, it is considered technically clean.
Technical cleanliness is particularly important in the following sectors:
- Automotive and electric vehicles
- Medical industry
- Mechanical engineering
- Additive manufacturing
- Electrical engineering and battery production
- Optical industry
- Oil analysis and Hydraulics
Thanks to technological progress, many industries require increasingly complex systems. As early as the 1990s, there was an increase in damage caused by contamination on components in the automotive industry. It quickly became clear that procedures had to be standardized. The so-called "VDA 19 Guideline", also known as "Testing of Technical Cleanliness – Particle Contamination of Functionally Relevant Automotive Parts", was published in 2004 and revised in 2015 as VDA 19 Part 1. At the international level, ISO 16232 (2007) forms the standard set of regulations. VDA 19 Part 2 from 2010 contains a guideline of rules for cleanliness-relevant orientation of assembly production.
VDA 19 Part 1 precisely defines various types of contamination. With the help of these definitions, contamination can be detected by cleanliness analyses and other technical cleanliness processes and appropriate decisions can be made. The aim is to preventively avoid residual dirt on components.
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Los proveedores, los fabricantes y los usuarios finales exigen estándares de calidad cada vez más elevados, por lo que es fundamental contar con un programa avanzado de limpieza técnica para eliminar la contaminación por partículas críticas a lo largo de todo el proceso de producción. Las soluciones de limpieza técnica de ZEISS identifican la causa primaria de la contaminación y permiten tomar la decisión correcta más rápido.
How do you identify the root cause? ZEISS Technical Cleanliness Solutions
Increase your productivity for object classification in ZEISS ZEN core Technical Cleanliness Analysis.
ZEISS Technical Cleanliness Workflow with Extraction and Filtration
Particle contamination is the enemy of efficiency, functionality and longevity of any product. For example, research has shown that the main source of failure in hydraulic and oil-filled systems is due to particulate contamination. Oil analysis helps minimize maintenance costs and improve machine uptime.
Las soluciones de limpieza técnica de ZEISS se han desarrollado en colaboración con la industria automotriz donde se tenía la necesidad de contar con sistemas de identificación y clasificación de partículas específicos, eficaces y fáciles de usar.
Como resultado, las soluciones de ZEISS son fáciles de aplicar, se pueden implementar en múltiples ubicaciones en cualquier entorno industrial o de fabricación y pueden ser usadas por operarios que no sean expertos en microscopía.
Limpieza del aceite
SAE AS 4059
In order to create cleanliness reports with all relevant data in one work step ZEISS microscopes and HYDAC extraction instruments are able to exchange data in a seamless workflow into one report for more productivity.
Learn all about how ZEISS integrates data from HYDAC devices into reporting in our magazine. A success story of technical cleanliness for the automotive industry.
Particles between moving parts, e.g. ball bearing
Particles in injection nozzles, e.g. from engines
Particles in oil and lubricants
Particles between electrical contacts, e.g. printed circuit board
Particles in syringes and implants
In addition to the quantification of particles and the measurement of their size, the standards for technical cleanliness also require a differentiation between metallic-glossy and non-glossy particles. Conventional methods can only make this distinction by scanning the filter membrane twice, each time with different polarizer and analyzer orientations. With the award-winning ZEISS One-Scan Technology, this is now possible with just one scan - reducing the time-to-result by up to 50 percent. In March 2021, the Fraunhofer Institute for Manufacturing Engineering and Automation (IPA) awarded ZEISS with its One-Scan Technology first place in the REINER! Fraunhofer Purity Technology Award.
The evaluation with ZEISS ZEN core Technical Cleanliness Analysis includes:
- A fully automatic evaluation
- Information on size, length, area and coordinates of the artifacts
- The distinction between metallic shiny and non-metallic shiny particles can be made with a single scan of the filter membrane
- Artifacts with a division into size classes, as a point cloud with product fingerprint
Technical cleanliness is part of the ZEN core software portfolio from the industrial microscopy sector. To optimize particle classification, ZEISS now offers ZEISS ZEN core users the Technical Cleanliness Analysis („TCA“) solution with three pre-trained modules based on machine learning. This module offers the functionality to classify particles based on measured parameters of an analyzed image. Samples are analyzed via three pre-trained machine learning models which can be additionally trained by users & customers. Samples are analyzed via gray scale determination and the pre-trained Machine Learning model for object classification runs in the background in the new TCA job templates, while the type classification is checked in parallel, based on the existing particle measurement results. This additional check of the type classification via machine learning algorithms „looks at” the particle results obtained with the classical analysis for size, shape, intensity and type classification, among others, and combines the various features into a large number of uncorrelated decision trees. The results are evaluated individually for each decision tree using the classification trained to the object classification model. The result is an automatic prediction of the particle type.
Particle Image with and without object classification in comaprison: e.g. with 10 samples this means a potential time saving of 3.5 hours/day.
El portafolio de soluciones de ZEISS permite combinar la detección y la clasificación de partículas en un flujo de trabajo muy eficiente que no solo localiza partículas, sino que ayuda a clasificarlas según el origen de la contaminación o del desgaste.
Con ZEISS puede relacionar datos procedentes de microscopios tanto ópticos como electrónicos en un solo flujo de trabajo para obtener información más exhaustiva.
Itemize particles by quantity, size distribution and morphology, and distinguish metallic from non-metallic particles and fibers down to 2 μm. Create cleanliness reports according to industry standards.
Characterize process-critical particles and identify critical particlesusing correlative microscopy, which combines your data from both light and electron microscopes in a single workflow.
Measure the morphological properties of particles and use fully automated elemental analysis to classify particles by chemical composition. ZEISS SmartPI, the particle analysis software for electron microscopes, automates the detection, analysis, and classification of particles, combining microscope control, image processing and elemental analysis into a single application.
ZEISS SteREO Discovery.V8
ZEISS Axio Zoom.V16
ZEISS Axio Imager 2
ZEISS Axioscope 7
ZEISS Sigma 300
Your benefits of industrial metrology solutions from ZEISS:
- Faster analyses and decisions with the latest metrology
- For technical cleanliness in production, electrical engineering, the automotive industry and many more
- Particle measurement according to established industry standards (e.g. VDA 19.1, ISO 16232)
- Contamination of residual dirt according to established cleanliness tests
- Testing and cleanliness analysis according to standardized extraction procedures
- Comprehensive range of measurement services: from maintenance, servicing and spare parts to software and hardware upgrades, calibration, planning and consulting
- Support for you and your employees for every metrology challenge through training and education in our ZEISS Metrology Academy